17th European FIB Users Group Meeting (EFUG2013)
Program and presentations
Monday 30 September 2013, Arcachon, France.

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Presentations

• Measurement of residual stress by focused ion beam milling
  Marco Sebastiani, Department of Engineering University "Roma Tre", Rome, Italy
  Presentation

• Universal pattern generating system for fib applications
  Alexey S. Kolomiytsev, Oleg A. Ageev, Vladimir A. Smirnov, Southern Federal University, Russia
  Presentation

• Failure Analysis in the SEM/FIB
  Andreas Rummel, Klaus Schock, Gregor Renka, Matthias Kemmler, Stephan Kleindiek, Kleindiek Nanotechnik GmbH, Reutlingen, Germany
  

• FIB applications in the nano-technology world
  Hugo Bender, IMEC, Leuven, Belgium
  Presentation

• SPM probe modification using Focused Ion Beam
  Alexey S. Kolomiytsev, Oleg A. Ageev, Vladimir A. Smirnov, Southern Federal University, Russia
  Presentation

• High resolution 3D FIB/SEM Imaging of fully hydrated frozen biological samples
  Andreas Schertel, Carl-Zeiss-Straße 56, 73446 Oberkochen
  

• Plasma focused ion beam : 3D tomography and innovative applications
  Anne Delobbe, Vincent Morin, Olivier Salord, Pierre Sudraud, Tomáš Hrncír, Lukáš Hladík, Jaroslav Jiruše, Filip Lopour, Orsay Physics S.A., Fuveau, France; TESCAN a.s., Brno, Czech Republic
  

• Insitu mechanical measurements to assess the effects of a bioglass on dentine and enamel surfaces
  Richard Langford, Cavendish Laboratory Cambridge, GSK, UK
  

• Localised FIB Deprocessing on Advanced Process Technologies
  David Donnet, Oleg Sidorov, Pete Carleson, Chad Rue and Surendra Madala, FEI Company 5350 NE Dawson Creek Drive, Hillsboro, USA
  Presentation

• TEM Lamellae preparation on a Plastic Logic Multi-Composite System of an Organic Electronic Device
  Sylvia Mucke, Plastic Logic GmbH, Dresden, Germany
  

• Deprocessing of latest copper technologies for circuit edit and failure analysis
  David Serre, Leng Ma, Pascal Gounet, ST Microelectronics SA, Grenoble Cedex
  

Sponsoring