17th European FIB Users Group Meeting (EFUG2013)
Program and presentations
Monday 30 September 2013, Arcachon, France.
Presentations
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Measurement of residual stress by focused ion beam milling
Marco Sebastiani, Department of Engineering University "Roma Tre", Rome, Italy
Presentation
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Universal pattern generating system for fib applications
Alexey S. Kolomiytsev, Oleg A. Ageev, Vladimir A. Smirnov, Southern Federal University, Russia
Presentation
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Failure Analysis in the SEM/FIB
Andreas Rummel, Klaus Schock, Gregor Renka, Matthias Kemmler, Stephan Kleindiek, Kleindiek Nanotechnik GmbH, Reutlingen, Germany
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FIB applications in the nano-technology world
Hugo Bender, IMEC, Leuven, Belgium
Presentation
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SPM probe modification using Focused Ion Beam
Alexey S. Kolomiytsev, Oleg A. Ageev, Vladimir A. Smirnov, Southern Federal University, Russia
Presentation
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High resolution 3D FIB/SEM Imaging of fully hydrated frozen biological samples
Andreas Schertel, Carl-Zeiss-Straße 56, 73446 Oberkochen
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Plasma focused ion beam : 3D tomography and innovative
applications
Anne Delobbe, Vincent Morin, Olivier Salord, Pierre Sudraud, Tomáš Hrncír, Lukáš Hladík, Jaroslav Jiruše, Filip Lopour, Orsay Physics S.A., Fuveau, France; TESCAN a.s., Brno, Czech Republic
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Insitu mechanical measurements to assess the effects of a bioglass on dentine and enamel surfaces
Richard Langford, Cavendish Laboratory Cambridge, GSK, UK
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Localised FIB Deprocessing on Advanced Process Technologies
David Donnet, Oleg Sidorov, Pete Carleson, Chad Rue and Surendra Madala, FEI Company 5350 NE Dawson Creek Drive, Hillsboro, USA
Presentation
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TEM Lamellae preparation on a Plastic Logic Multi-Composite System of an Organic Electronic Device
Sylvia Mucke, Plastic Logic GmbH, Dresden, Germany
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Deprocessing of latest copper technologies for circuit edit and failure analysis
David Serre, Leng Ma, Pascal Gounet, ST Microelectronics SA, Grenoble Cedex
Sponsoring
The EFUG2013 meeting was kindly sponsored by : Carl-Zeiss, FEI, OrsayPhysics
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Contact : European FIB Users Group