11th European FIB Users Group Meeting (EFUG2007)
Programme and presentations
Monday 8 October 2007, Arcachon, France

print EFUG2007 programme

Oral presentations

Overview lecture

Nano and Micro Fabrication

Devices and Circuits

Sample Preparation, Instrumentation and Microscopy

Top : EFUG2007 program


Top : EFUG2007 program


The EFUG2007 meeting was kindly sponsored by : Carl-Zeiss, Credence, FEI and Raith.

Top : EFUG2007 program


Contact : European FIB Users Group