Forthcoming FIB related conferences
European Focused Ion Beam Users Group Meeting, EFUG2017
28 September 2017, Bordeaux, France.
11th Annual FIB SEM Workshop
April 30 - May 2, 2018
Canadian Centre for Electron Microscopy (CCEM),McMaster University, Hamilton, Ontario, Canada.
Abstract deadline 30th March 2018
2nd European FIB Network Workshop
19-20 June 2018, Grenoble, France.
Microscopy & Microanalysis 2018, Symposium A12 "The FIB-SEM Laboratory"
5-9 August, Baltimore, MD.
19th International Microscopy Conference, IMC19, Session IT10 : "SEM, FIB, scanning probe and surface microscopy"
9-14 September 2018, Sydney, Australia.
Abstract deadline 1 March 2018
29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, ESREF2018
1-5 October 2018, Aalborg, Denmark.
Abstract deadline 23 March 2018
17th European Microscopy Congress 2020, EMC2020
23-28 August 2020, Copenhagen, Denmark.
Please send full details of forthcoming FIB-related meetings to : European FIB Users Group