Forthcoming FIB related conferences
10th Annual FIB SEM Workshop
4 March 2017, NIST, Gaithersburg, MD.
Abstract deadline 3 February 2017
European Focused Ion Beam Users Group Meeting, EFUG2017
28 September 2017, Bordeaux, France.
2nd European FIB Network Workshop
19-20 June 2018, Grenoble, France.
19th International Microscopy Conference, IMC19,Session IT10 : "SEM, FIB, scanning probe and surface microscopy"
9-14 September 2018, Sydney, Australia.
Abstract deadline 1 February 2018
29th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, ESREF2018
1-5 October 2018, Aalborg, Denmark.
Abstract deadline 12 March 2018
17th European Micrsocopy Congress 2020, EMC2020
23-28 August 2020, Copenhagen, Denmark.
Please send full details of forthcoming FIB-related meetings to : European FIB Users Group