16th European FIB Users Group Meeting (EFUG2012)
Program and presentations
Monday 1 October 2012, Cagliari, Italy.

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Presentations

• SEM/FIB with TOF-SIMS: Introduction and Application Examples
  James Whitby, Deborah Alberts and Johann Michler Empa, Swiss Federal Laboratories for Materials Science and Technology, Laboratory for Mechanics of Materials and Nanostructure, Switzerland.
  Presentation

• FIB Micro/Nano fabrication of silicon master for biomedical applications
  G. Firpo, L. Repetto, E. Angeli, P. Fanzio, P.Guida, V. Ierardi, C. Manneschi, V. Mussi, U. Valbusa Nanomed lab, Dipartimento di Fisica - Università degli Studi di Genova, Italy.
  Presentation

• Give your microscope a hand, Recent advances in handling & chracterizing materials and electronics from micro to nano scale
  A. Smith, A. Rummel, K. Schockand, S. Kleindiek, Kleindiek Nanotechnik, Germany.
  Presentation

• FIB New Chemistries for Next Generation Circuit Edit
  H.Tanaka, K.Shah, R,Jain, DCG systems Inc, USA.

• Helium Ion Microscopy
  P. Gnauck, Carl-Zeiss, Oberkoche, Germany.
  Presentation

• Deterministic fabrication of reflective mirror on an optical fibre
  Jining Sun, Heriot-Watt University, Edinburgh, UK.
  Presentation

• “Free of Charge” FIB Circuit Edit of ICs on 40nm Node
  Valery Ray, PBS&T, MEO Engineering Co., Inc. USA.
  Presentation

• New plasma-FIB column
  A. Delobbe, V. Morin, Orsay Physics, Fuveau, France.

• In situ Mechanical Measurements to Access the Effects of Bioglass on Dentin and Enamel Surfaces.
  M. Payne, University Cambridge, UK.
  Presentation

• Biodestruction of polyurethane by Staphylococcus aureus (an investigation by SEM, TEM and FIB)
  Didenko L.V.1, Milani M.5, Avtandilov G.A.2, Shevlyagina N.V. 1, Smirnova T.A. 1, Lebedenko I.Y.2 , Tatti F.3 , Savoia C.4, Evans G.5 1 Gamaleya Research Institute for Epidemiology and Microbiology, Moscow, Russia ; 2 Moscow State Medical and Stomatological University, Moscow, Russia ; 3 FEI Italia, Milano, Italy ; 4 ST Microelectronics, Agrate Brianza. Italy ; 5 Dipartimento di Scienza dei Materiali - Università degli Studi di Milano- Bicocca,Milano,Italy.

• 3D EBIC Tomography by FIB
  S. Podda1, E. Musu1, M.Vanzi2, 1 Sardegna Ricerche – Lac. Piscinamanna Ed3. Pula (CA) ; 2 Università degli studi di Cagliari – Piazza D’Armi – Cagliari - Italy.
  Presentation

• Package level editing with plasma FIB technology
  D. Donnet, FEI, Eindhoven, The Netherlands.
  Presentation

• 3D Characterisation of the Occlusion of Dentine Tubules
  H. Boswell, University Cambridge.

• 3D FIB-SEM image segmentation and advanced characterization
  D. Lichau, VSG, Bordeaux, France.
  Presentation

• FIB/TEM analysis of Si/Ge/Sn alloys:results, problems and perspectives
  A. Benedetti, *S. Stefanov, *J. Serra, * P. Gonzàlez,*S. Chiussi, CACTI, University of Vigo ; *New Materials Group, University of Vigo, Spain.
  Presentation

Sponsoring