16th European FIB Users Group Meeting (EFUG2012)
Program and presentations
Monday 1 October 2012, Cagliari, Italy.
Presentations
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SEM/FIB with TOF-SIMS: Introduction and Application Examples
James Whitby, Deborah Alberts and Johann Michler Empa, Swiss Federal Laboratories for Materials Science and
Technology, Laboratory for Mechanics of Materials and Nanostructure, Switzerland.
Presentation
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FIB Micro/Nano fabrication of silicon master for biomedical applications
G. Firpo, L. Repetto, E. Angeli, P. Fanzio, P.Guida, V. Ierardi, C. Manneschi, V. Mussi, U. Valbusa
Nanomed lab, Dipartimento di Fisica - Università degli Studi di Genova, Italy.
Presentation
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Give your microscope a hand, Recent advances in handling & chracterizing materials and electronics from micro to nano scale
A. Smith, A. Rummel, K. Schockand, S. Kleindiek, Kleindiek Nanotechnik, Germany.
Presentation
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FIB New Chemistries
for Next Generation Circuit Edit
H.Tanaka, K.Shah, R,Jain, DCG systems Inc, USA.
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Helium Ion Microscopy
P. Gnauck, Carl-Zeiss, Oberkoche, Germany.
Presentation
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Deterministic fabrication of reflective mirror on an optical fibre
Jining Sun, Heriot-Watt University, Edinburgh, UK.
Presentation
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“Free of Charge” FIB Circuit Edit of ICs on 40nm Node
Valery Ray, PBS&T, MEO Engineering Co., Inc. USA.
Presentation
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New plasma-FIB column
A. Delobbe, V. Morin, Orsay Physics, Fuveau, France.
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In situ Mechanical Measurements to Access the Effects of Bioglass on
Dentin and Enamel Surfaces.
M. Payne, University Cambridge, UK.
Presentation
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Biodestruction of polyurethane by
Staphylococcus aureus
(an investigation by SEM, TEM and FIB)
Didenko L.V.1, Milani M.5, Avtandilov G.A.2,
Shevlyagina N.V. 1, Smirnova T.A. 1, Lebedenko
I.Y.2 , Tatti F.3 , Savoia C.4, Evans G.5
1 Gamaleya Research Institute for Epidemiology and Microbiology, Moscow,
Russia ;
2 Moscow State Medical and Stomatological University, Moscow, Russia ;
3 FEI Italia, Milano, Italy ;
4 ST Microelectronics, Agrate Brianza. Italy ;
5 Dipartimento di Scienza dei Materiali - Università degli Studi di Milano-
Bicocca,Milano,Italy.
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3D EBIC Tomography by FIB
S. Podda1, E. Musu1, M.Vanzi2,
1 Sardegna Ricerche – Lac. Piscinamanna Ed3. Pula (CA) ;
2 Università degli studi di Cagliari – Piazza D’Armi – Cagliari - Italy.
Presentation
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Package level editing with plasma FIB technology
D. Donnet, FEI, Eindhoven, The Netherlands.
Presentation
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3D Characterisation of the Occlusion of Dentine Tubules
H. Boswell, University Cambridge.
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3D FIB-SEM image segmentation and advanced characterization
D. Lichau, VSG, Bordeaux, France.
Presentation
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FIB/TEM analysis of Si/Ge/Sn alloys:results, problems and perspectives
A. Benedetti, *S. Stefanov, *J. Serra, * P. Gonzàlez,*S. Chiussi,
CACTI, University of Vigo ;
*New Materials Group, University of Vigo, Spain.
Presentation
Sponsoring
The EFUG2012 meeting was kindly sponsored by : Carl-Zeiss, FEI, OrsayPhysics and VSG
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Contact : European FIB Users Group